- Central Lab
- Material Analysis Lab
- Failure Analysis Lab
- Electrical Research Lab
- Reliability Test Lab
- Simulation Lab
- Pilot Lab
- List of Analysis and Test Services
- Test Flowchart
Central Laboratory Introduction
The central lab is public test service platform of Sunlord and has a Material Analysis Lab, Failure Analysis Lab, a Reliability Test Lab, an Electrical Research Lab, a Simulation Lab and a Pilot Lab. The central lab owns numerous advanced imported test instruments and simulation softwares which provide structure analysis, material characterization, failure mechanism analysis, electrical specification research, EMC test , magnetism devices simulation, R&D experiments and small-lot production of electronic materials.
The central lab founded in 2011 covers an area about 5000m2 and owns equipment assets more than fifty million RMB. The central lab has more than sixty professional experimenters and an expert consultants team made up with product managers, R&D engineers and quality engineers. The central lab rooted in the localization has a wide and deep cooperation with equipment suppliers, third-party test organizations and colleges and universities and provide strong technique support and all-directional test services for internal and external customers.
"Sunlord-key sight Electronic Measurement Joint Laboratory" was established in september,2016.Measuring and testing technique research,testing platform construction and talent cultivation can be conducted at the joint laboratory to meet Sunlord’s needs.
In order to enhance management level and technical capacity,CNAS Accreditation project was started in september,2016 by the central lab.The quality management systems was eatablished in december,2016 according to ISO/IEC 17025:2005 General Requirements for the Competence of Testing and Calibration Laboratories.The central lab acquired CNAS accreditation in december,2017.
Services
- Microstructure analysis and characterization, element analysis
- Rheological ans heated changed behaviors analysis
- Failure analysis of electron components
- Reliability tests
- Electric performance test of electronics
- R ＆ D experiments of electronic materials and production manufactured experiments from the production of sample prototype to small batch manufacturing.
CNAS Accreditation Test Items List
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№.
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Test object
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Item/ Parameter
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Code of field
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Title， Code of standard or method
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Note
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№.
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Item/ Parameter
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1
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Electronic components and raw materials (powder, block solid)
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1
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Surface microstructure
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030512
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General rules for analytical scanning electron microscopy JYT 010-1996
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2
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Phase analysis
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030513
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General rules for X-ray polycrystalline diffraciometry JYT 009-1996 4.1 Qualitative analysis of phase composition
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2
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The precious metal paste used in electronic components
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1
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Viscosity
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030508
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Test methods of precious metals pastes used for microelectronics—Determination of viscosity GB_T 17473.5-2008
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3
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Ceramic material
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1
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Differential thermal curve
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030507
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Standard test method for differential thermal analysis of row materials of ceramic GB/T 6297-2002
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4
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Fine ceramic material ( block solid)
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1
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coefficient of thermal expansion
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050999
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Fine ceramics（advanced ceramics,advanced technical ceramics)—Test method for linear expansion of monolithic ceramics by push-rod technique GB/T 16535-2008
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5
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Powder particles
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1
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Specific surface area
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030504
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Determination of the Specific surface area of solids by gas adsorption using the BET method GB/T 19587-2004
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2
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Particle size analysis
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030502
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Particle size analysis—Laser diffraction methods GB∕T 19077-2016
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6
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Electronic components of the structure of ceramic materials
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1
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dielectric constant
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041509
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Structure ceramic materials used in electronic component and device GB/T 5593-2015 5.11 permittivity and
dielectric loss angle tangent value
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Test method for complex permittivity of solid dielectric materials at microwave frequencies GB/T 5597-1999
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2
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Dielectric loss Angle tangent value
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041504
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Structure ceramic materials used in electronic component and device, GB/T 5593-2015 5.11 permittivity and
dielectric loss angle tangent value
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Test method for complex permittivity of solid dielectric materials at microwave frequencies GB/T 5597-1999
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Test method for properties of structure ceramic used in electronic component and device-Part 4: Test method for permittivity anddielectric loss angle tangent value GB/T 5594.4-2015
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7
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Soft ferrite material
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1
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Hysteresis loop
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030404
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Measuring methods for soft ferrite materials SJ 20966-2006 9 hysteresis loop and Bs, Br, Hc measurements
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2
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Saturation magnetic flux density(Bs）
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030404
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Measuring methods for soft ferrite materials SJ 20966-2006 9 hysteresis loop and Bs, Br, Hc measurements
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3
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Remanence(Br)
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030404
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Measuring methods for soft ferrite materials SJ 20966-2006 9 hysteresis loop and Bs, Br, Hc measurements
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4
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Coercivity（Hc）
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030404
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Measuring methods for soft ferrite materials SJ 20966-2006 9 hysteresis loop and Bs, Br, Hc measurements
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5
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Power consumption
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030404
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Measuring methods for soft ferrite materials SJ 20966-2006 8.2 Power consumption
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8
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Nanohenry range chip inductor
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1
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Inductance
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040602
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High frequency inductive components – Electrical characteristics and measuringmethods –Part 1: Nanohenry range chip inductor IEC 62024-1:2008-02 3.1 Inductance
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2
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Quality factor
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040602
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High frequency inductive components – Electrical characteristics and measuringmethods –Part 1: Nanohenry range chip inductor IEC 62024-1:2008-02 3.2 Quality factor
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3
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Impedance
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040602
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High frequency inductive components – Electrical characteristics and measuringmethods –Part 1: Nanohenry range chip inductor IEC 62024-1:2008-02 3.3 Impedance
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4
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Self-resonance frequency
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040602
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High frequency inductive components – Electrical characteristics and measuringmethods –Part 1: Nanohenry range chip inductor IEC 62024-1:2008-02 4Resonance frequency
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5
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DC resistance
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040602
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High frequency inductive components – Electrical characteristics and measuringmethods –Part 1: Nanohenry range chip inductor IEC 62024-1:2008-02 5 DC resistance
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9
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Varistor
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1
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leakage current
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040601
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Varistors for in electronic equipmentPart1:Generic specification GB/T 10193-1997 2.2.13 leakage current
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2
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varistor voltage
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040601
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Generic specification for varistors GJB 1782A-2015 3.8 varistor voltage
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10
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Passive device
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1
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Insertion loss
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040699
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Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.2
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2
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ripple in band
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040699
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Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.3
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3
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Amplitude Unbalance (only for power splitter)
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040699
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Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.4
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4
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Coupling and tolerances (couplers only)
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040699
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Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.5
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5
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Isolation
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040699
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Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.6
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6
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Rejction of Out band
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040699
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Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.7
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7
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Voltage Standing Wave Ratio
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040699
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Indoor signal distributing system-part5:Technical requirement and test method for passive devices YD/T 2740.5-2014 11.9
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11
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Electronic Component
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1
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The grinding and polishing of the specimen, the cross section of the metal layer
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030202
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Metallic coatings—Measurement of coating thickness—Scanning electron microscope method GB/T 31563-2015
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2
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Surface metallographic analysis
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030202
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Inspection methods of microstructure for metals GBT 13298-2015
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3
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PCB board bending test
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040118
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Environmental testing for electric and eletronic products—Part 2：Test methods—Test U：Robustness of terminations and integral mounting devices GB/T 2423.60-2008 8.5.1
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4
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Shear (adhesion) test
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040118
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Environmental testing for electric and eletronic products—Part 2：Test methods—Test U：Robustness of terminations and integral mounting devices GB/T 2423.60-2008 8.5.3
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5
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Free fall test
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040108
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Environmental testing for electric and eletronic products—Part 2：Test methods—Test Ed：Free fall GB/T 2423.8-1995 The first method
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6
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Package drop test
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040199
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Packaging—Transport packages—Vertical impact test method by droping GB/T 4857.5-92
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7
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Roller drop test
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040199
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Environmental testing for electric and eletronic products—Part 2：Test methods—Test Ed：Free fall GB/T 2423.8-1995 The second method
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8
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Low frequency vibration test
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040107
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Test methods for electronic and electrical component pasrts GJB 360B-2009 Method 201
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9
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High frequency vibration test
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040107
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Environmental testing for electric and eletronic products—Part 2：Test methods—Test Fc：Vibration（Sinusoidal） GB/T 2423.10-2008
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10
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Random vibration test
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040107
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Environmental testing for electric and eletronic products—Part 2：Test methods—Test Fh：Vibration，broad-band random（digital control）and guidance GB/T 2423.56-2006
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11
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Mechanical Shock Test
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040105
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GB/T 2423.5-1995Environmental testing for electric and electronic products-Part 2 :Test methods-Test Ea and guidance:Shock GB/T 2423.5-1995
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12
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Resistance to Soldering Heat
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040117
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Environmental testing for electric and electronic products-Part 2 :Test methods-Test T:Soldering GB/T 2423.28-2005 Test Tb
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13
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Solderability Test
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040117
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Environmental testing for electric and electronic products-Part 2 :Test methods-Test T:Soldering GB/T 2423.28-2005 Test Ta
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14
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Thermal Shock Test-Air to Air
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040114
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Environmental testing for electric and electronic products-Part 2 :Test methods-Test N:Change of temperature GB/T 2423.22-2012 Test Na
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Temperature range: high temperature +60℃, ~+200℃, low temperature -70℃, ~0℃;
Internal volume: 110L
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15
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Temperature Cycling Test
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040114
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Environmental testing for electric and electronic products-Part 2 :Test methods-Test N:Change of temperature GB/T 2423.22-2012 Test Nb
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Temperature range: -40℃, ~+180℃
Humidity range: 10%RH~98%RH
Internal volume: 400L
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16
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Low Temperature Storage Test
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040101
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Environmental testing for electric and electronic products-Part 2 :Test methods-Test A:Cold GB/T 2423.1-2008 5.2 Test Ab
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Temperature range: -75℃, ~+150℃
Internal volume: 60L
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17
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High Temperature Storage Test
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040102
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Environmental testing for electric and electronic products-Part 2 :Test methods-Test B:Dry heat GB/T 2423.2-2008 5.2 Test Bb
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Temperature range: RT~+200
Internal volume: 252L
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18
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Steady State Temperature Humidity Life Test
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040103
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Environmental testing for electric and electronic products-Part 2 :Test methods-Test Cy:Damp heat,steady state,acceleerated test primarily intended for components GB/T 2423.50-2012
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Temperature range: -40℃, ~+180℃
Humidity range: 10%RH~98%RH
Internal volume: 400L
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19
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Damp Heat Test
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040103
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Environmental testing for electric and electronic products-Part 2 :Test methods-Test Cab:Damp heat,steady state GB/T 2423.3-2006
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Temperature range: -40℃, ~+180℃
Humidity range: 10%RH~98%RH
Internal volume: 400L
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20
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Temperature and humidity combined cycle test
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040104
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Environmental testing for electric and electronic products-Part 2 :Test methods-Test Db:Damp heat,cyclic GB/T 2423.34-2012
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Temperature range: -40℃, ~+180℃
Humidity range: 10%RH~98%RH
Internal volume: 400L
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21
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Salt Spray test
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040119
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Environmental testing for electric and electronic products-Part 2 :Test methods-Test Ka:Salt mist GB/T 2423.17-2008
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Internal volume: 270L
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22
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electric capacity
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040699
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Test methods for electronic and electrical component pasrts GJB 360B-2009 Method 305
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23
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dielectric withstand voltage
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041509
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Test methods for electronic and electrical component pasrts GJB 360B-2009 Method 301
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24
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dielectric resistance
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041502
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Test methods for electronic and electrical component pasrts GJB 360B-2009 Method 302
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